| |y> = 2-½(|yliving> + |ydead>) |
| rof = Sm|cm|2 |am><am| | ||
| raf = Sm|cm|2 |qm><q m| |
| raf = Sm,m'< ym |ym'>|qm'><qm| |
| |y> ---> |ym>, |
| p(n|m)=|<ym|bn>|2. |
Whereas von Neumann's projection postulate is inapplicable as a measurement principle, is it, in the generalized form
given above, a highly useful and practically applied preparation principle (sometimes referred to as a `preparative measurement' or a filter). That it, yet, is presented so often as a feature of
measurement is a consequence of a very restricted view of measurement, in which the states
|ym> correspond to outgoing beams that do not spatially overlap (see figure 3).
In that case the measurement result m is determined by the beam the particle is found in after leaving the apparatus. In this case the final position of the
microscopic object is taken as the pointer observable. Due to this very special choice of the pointer observable the preparation
of the final state of the object is important for the procedure to function as a measurement of a property of the initial state. In general pointer observables are quite different, however. In general they correspond to properties of the measuring instrument rather than the microscopic object.